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AuthorDudley, Michael (2)Raghothamachar, Balaji (2)
Venkatesh, T. (2)
Ding, Zihao (1)Su, Dong. (1)Wu, Fangzhen (1)SubjectMaterials Science (2)Boron Phosphide thin films, crystal quality, sapphire single crystal, SEM, Synchrotron X-ray Topography (1)Crystal growth, Dislocation, High resolution transmission electron microscopy, Stacking fault, Synchrotron x-ray topography, Wide bandgap semiconductor (1)... View MoreDate Issued
2014 (2)
Has File(s)Yes (2)