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AuthorDudley, Michael (1)Raghothamachar, Balaji (1)Su, Dong. (1)
Venkatesh, T. (1)
Wu, Fangzhen (1)Subject
Crystal growth, Dislocation, High resolution transmission electron microscopy, Stacking fault, Synchrotron x-ray topography, Wide bandgap semiconductor (1)
Materials Science (1)... View MoreDate Issued2014 (1)Has File(s)Yes (1)