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Raghothamachar, Balaji (23)
Dudley, Michael (20)Venkatesh, T.A.. (5)Sokolov, Jonathan (4)GOUE, Ouloide Yannick (3)Hossain, Anwar. (3)Venkatesh, T. A.. (3)Wu, Shuang (3)Yang, Xiaolin (3)Su, Dong. (2)... View MoreSubject
Materials Science (23)
Cadmium overpressure, Crystal growth, Defect characterization, Minority carrier lifetime, silicon carbide, cadmium zinc telluride, Wide band-gap materials (3)defects, III-nitrides, semiconductor, synchrotron X-ray topography (3)HRXRD, semiconductor, x-ray topography (3)Boron Phosphide thin films, crystal quality, sapphire single crystal, SEM, Synchrotron X-ray Topography (1)Characterization, Crystallography, Defect Analysis, Semiconductor, Silicon Carbide, X-ray Topography (1)characterization, defect, semiconducotr, wide bandgap, X-ray topography (1)Characterization, HRXRD, Semiconductor, SWBXT, TEM, Thin Film (1)characterization, ray tracing, stress distribution, threading dislocation (1)Crystal growth, Dislocation, High resolution transmission electron microscopy, Stacking fault, Synchrotron x-ray topography, Wide bandgap semiconductor (1)... View MoreDate Issued2014 (6)2016 (6)2013 (4)2017 (4)2015 (2)2012 (1)Has File(s)Yes (23)