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Dudley, Michael (26)
Raghothamachar, Balaji (20)Venkatesh, T.A.. (6)Sokolov, Jonathan (4)Venkatesh, T. A.. (4)GOUE, Ouloide Yannick (3)Hossain, Anwar. (3)Venkatesh, T. (3)Wu, Shuang (3)Yang, Xiaolin (3)... View MoreSubject
Materials Science (26)
Cadmium overpressure, Crystal growth, Defect characterization, Minority carrier lifetime, silicon carbide, cadmium zinc telluride, Wide band-gap materials (3)defects, III-nitrides, semiconductor, synchrotron X-ray topography (3)HRXRD, semiconductor, x-ray topography (3)alkali antimonide (1)blend thin films, PEO/PS, scCO2 (1)Boron Phosphide thin films, crystal quality, sapphire single crystal, SEM, Synchrotron X-ray Topography (1)Characterization, Crystallography, Defect Analysis, Semiconductor, Silicon Carbide, X-ray Topography (1)characterization, defect, semiconducotr, wide bandgap, X-ray topography (1)Characterization, HRXRD, Semiconductor, SWBXT, TEM, Thin Film (1)... View MoreDate Issued2014 (6)2016 (6)2017 (5)2012 (4)2013 (4)2015 (1)Has File(s)Yes (26)