Browsing by Author Venkatesh, T.A..

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Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
1-Dec-2013Characterization of Defects in Single Crystal Epitaxial Silicon for Solar cellsDudley, Micheal; Wang, Hao; Department of Materials Science and Engineering.; Raghothamachar, Balaji; Venkatesh, T.A..
1-Dec-2014Effects of Marine Environments and Cyclic Loading on Carbon Fiber-Vinyl Ester CompositesAlkhader, Maen; Afshar, Arash; Department of Mechanical Engineering.; Korach, Chad; Chiang, Fu-Pen; Venkatesh, T.A..
1-Dec-2016Evaluation of 4H Silicon Carbide and Gallium Nitride Crystals for Power Electronics & Lighting ApplicationsDudley, Michael; Yang, Xiaolin; Department of Materials Science and Engineering; Raghothamachar, Balaji; Venkatesh, T.A..
1-Dec-2016Evaluation of 4H Silicon Carbide and Gallium Nitride Crystals for Power Electronics & Lighting ApplicationsDudley, Michael; Yang, Xiaolin; Department of Materials Science and Engineering; Raghothamachar, Balaji; Venkatesh, T.A..
1-Dec-2016Evaluation of 4H Silicon Carbide and Gallium Nitride Crystals for Power Electronics & Lighting ApplicationsDudley, Michael; Yang, Xiaolin; Department of Materials Science and Engineering; Raghothamachar, Balaji; Venkatesh, T.A..
1-May-2012Morphological Control of Poly(ethylene oxide)/Polystyrene Blend Thin Films by Using Supercritical Carbon DioxideKoga, Tadanori; Chen, Xiameng; Department of Materials Science and Engineering; Dudley, Michael; Venkatesh, T.A..
1-Dec-2015Observation of Ferroelastic Toughening in Ceramic Oxides by Polarized Raman SpectroscopyGentleman, Molly M; Schubert, Amanda Brooke; Department of Materials Science and Engineering; Gouma, Perena; Venkatesh, T.A..
1-Dec-2015Observation of Ferroelastic Toughening in Ceramic Oxides by Polarized Raman SpectroscopyGentleman, Molly M; Schubert, Amanda Brooke; Department of Materials Science and Engineering; Gouma, Perena; Venkatesh, T.A..
1-Dec-2015Observation of Ferroelastic Toughening in Ceramic Oxides by Polarized Raman SpectroscopyGentleman, Molly M; Schubert, Amanda Brooke; Department of Materials Science and Engineering; Gouma, Perena; Venkatesh, T.A..
1-Dec-2014Properties of Boron Phosphide Films Grown on Different Substrates and Conoscopic Study of SapphireDudley, Michael; Raghothamachar, Balaji; Chen, Ruifen; Department of Materials Science and Engineering.; Venkatesh, T.A..
1-May-2012Structure characterization of adsorbed poly (ethylene oxide) layers on solid substrateTadanori, Koga; Chen, Fen; Department of Materials Science and Engineering; Dudley, Michael; Venkatesh, T.A..
1-Dec-2016Synchrotron X-ray Topography Analysis of Dislocation Line Directions in 4H-SiC Single CrystalsDudley, Michael; Yan, Jianing; Department of Materials Science and Engineering; Raghothamachar, Balaji; Venkatesh, T.A..
1-Dec-2016Synchrotron X-ray Topography Analysis of Dislocation Line Directions in 4H-SiC Single CrystalsDudley, Michael; Yan, Jianing; Department of Materials Science and Engineering; Raghothamachar, Balaji; Venkatesh, T.A..
1-Dec-2016Synchrotron X-ray Topography Analysis of Dislocation Line Directions in 4H-SiC Single CrystalsDudley, Michael; Yan, Jianing; Department of Materials Science and Engineering; Raghothamachar, Balaji; Venkatesh, T.A..